Abstract
The software faults of wearable computers can be divided by their influence on communication into the following kinds: (1) common faults which have little or no effect on communication; (2) fatal faults which have terrible effect on communication or interrupt communication. In order to evaluate the software reliability of wearable computers, a software reliability growth model (SRGM) is built based on the G-0 model. The test results show that SRGM is effective.
| Original language | English |
|---|---|
| Pages (from-to) | 919-921 |
| Number of pages | 3 |
| Journal | Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology |
| Volume | 35 |
| Issue number | 8 |
| State | Published - Aug 2003 |
| Externally published | Yes |
Keywords
- G-O Model
- Software reliability
- Software reliability growth model
- Wearable computer
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