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Software reliability growth model for wearable computer

  • School of Computer Science and Technology, Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The software faults of wearable computers can be divided by their influence on communication into the following kinds: (1) common faults which have little or no effect on communication; (2) fatal faults which have terrible effect on communication or interrupt communication. In order to evaluate the software reliability of wearable computers, a software reliability growth model (SRGM) is built based on the G-0 model. The test results show that SRGM is effective.

Original languageEnglish
Pages (from-to)919-921
Number of pages3
JournalHarbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology
Volume35
Issue number8
StatePublished - Aug 2003
Externally publishedYes

Keywords

  • G-O Model
  • Software reliability
  • Software reliability growth model
  • Wearable computer

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