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Sneak Circuit Analysis Covering Interface Circuits in Spacecraft Integrated Chips while Considering Faults

  • Weiming Liu
  • , Cen Chen*
  • , Kaiwen Xiao
  • , Mingtao Feng
  • , Haonan Zhang
  • , Guofu Zhai
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Beijing Aerospace Automatic Control Institute

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Sneak circuit analysis is a crucial reliability design process. In the design of spacecraft electronic systems, it is challenging to identify sneak circuits related to integrated chip interface circuits, and there are few targeted researches. In extreme working conditions, the coupling sneak circuits caused by the failure of integrated chips are difficult to identify, affecting the design optimization. The paper proposes a typical interface information specification model for integrated chips to simulate the electrical information characteristics of interfaces. And the typical failure models of intrinsic components inside the chip are determined through multi-physics field analysis. Then, based on the digital model, a sneak circuit diagnosis process based on excitation and fault injection are proposed, and a sneak circuit screening method based on Python virtual prototyping is implemented in the case study. Finally, the design constraint clues for the chip's external circuit are obtained, which provides a reference for related fault diagnosis and reliability optimization works.

Original languageEnglish
Title of host publication2024 6th International Conference on System Reliability and Safety Engineering, SRSE 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages222-228
Number of pages7
ISBN (Electronic)9798350356083
DOIs
StatePublished - 2024
Event6th International Conference on System Reliability and Safety Engineering, SRSE 2024 - Hangzhou, China
Duration: 11 Oct 202414 Oct 2024

Publication series

Name2024 6th International Conference on System Reliability and Safety Engineering, SRSE 2024

Conference

Conference6th International Conference on System Reliability and Safety Engineering, SRSE 2024
Country/TerritoryChina
CityHangzhou
Period11/10/2414/10/24

Keywords

  • failure mechanism
  • integrated chip
  • interface circuit
  • reliability design
  • sneak circuit analysis

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