TY - GEN
T1 - SmartBackup
T2 - 17th IEEE International Conference on High Performance Computing and Communications, IEEE 7th International Symposium on Cyberspace Safety and Security and IEEE 12th International Conference on Embedded Software and Systems, HPCC-ICESS-CSS 2015
AU - Huang, Min
AU - Wang, Yi
AU - Qiao, Liyan
AU - Liu, Duo
AU - Shao, Zili
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/11/23
Y1 - 2015/11/23
N2 - Unpredictable power outages in NAND flashbased Solid State Drives (SSDs) may cause system failure or reliability problems. Capacitors are widely adopted as the interim power supplier when power interruption happens. However, since the energy provided by backup capacitors is limited, and the capacitance of a capacitor will gradually degrade with time, it is imperative to improve the efficiency and reliability of the backup process for SSDs with capacitors. This paper presents a novel backup scheme called SmartBackupfor MLC NAND flash-based SSDs with backup capacitors. In SmartBackup, by exploiting the feature of the discharge process of capacitors, all available SSD channels are fully utilized and dynamically adjusted based on the available voltage, so data can be efficiently stored in a reliable manner. Moreover, in SmartBackup, to write data in a time/energyefficient manner with better reliability, we adopt a fast and reliable programming strategy by only writing LSB (Least Significant Bit) pages in MLC NAND flash. To the best of our acknowledge, this is the first work to jointly utilize the property of the multi-page architecture of MLC NAND flash and the discharge characteristic of capacitors to improvethe efficiency and reliability of the backup process in SSDswith backup capacitors. The experimental results show thatSmartBackup can effectively accelerate the backup processand improve the reliability.
AB - Unpredictable power outages in NAND flashbased Solid State Drives (SSDs) may cause system failure or reliability problems. Capacitors are widely adopted as the interim power supplier when power interruption happens. However, since the energy provided by backup capacitors is limited, and the capacitance of a capacitor will gradually degrade with time, it is imperative to improve the efficiency and reliability of the backup process for SSDs with capacitors. This paper presents a novel backup scheme called SmartBackupfor MLC NAND flash-based SSDs with backup capacitors. In SmartBackup, by exploiting the feature of the discharge process of capacitors, all available SSD channels are fully utilized and dynamically adjusted based on the available voltage, so data can be efficiently stored in a reliable manner. Moreover, in SmartBackup, to write data in a time/energyefficient manner with better reliability, we adopt a fast and reliable programming strategy by only writing LSB (Least Significant Bit) pages in MLC NAND flash. To the best of our acknowledge, this is the first work to jointly utilize the property of the multi-page architecture of MLC NAND flash and the discharge characteristic of capacitors to improvethe efficiency and reliability of the backup process in SSDswith backup capacitors. The experimental results show thatSmartBackup can effectively accelerate the backup processand improve the reliability.
KW - Capacitors
KW - Reliability
KW - SSD
UR - https://www.scopus.com/pages/publications/84961763055
U2 - 10.1109/HPCC-CSS-ICESS.2015.180
DO - 10.1109/HPCC-CSS-ICESS.2015.180
M3 - 会议稿件
AN - SCOPUS:84961763055
T3 - Proceedings - 2015 IEEE 17th International Conference on High Performance Computing and Communications, 2015 IEEE 7th International Symposium on Cyberspace Safety and Security and 2015 IEEE 12th International Conference on Embedded Software and Systems, HPCC-CSS-ICESS 2015
SP - 746
EP - 751
BT - Proceedings - 2015 IEEE 17th International Conference on High Performance Computing and Communications, 2015 IEEE 7th International Symposium on Cyberspace Safety and Security and 2015 IEEE 12th International Conference on Embedded Software and Systems, HPCC-CSS-ICESS 2015
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 24 August 2015 through 26 August 2015
ER -