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Six degrees of freedom displacement measurement system for wafer stage composed of hall sensors

  • Bo Zhao
  • , Weijia Shi*
  • , Jiawei Zhang
  • , Ming Zhang
  • , Xue Qi
  • , Jiaxin Li
  • , Feng Li
  • , Jiubin Tan
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This paper proposes a decoupled six degrees of freedom (DOF) displacement measurement methodology, which is accomplished by utilizing six pairs of permanent magnets and six Hall sensors. Firstly, the coordinate transformation was mathematically derived, which represented the relationships between the main coordinate system of the motion system and each body coordinate system of the Hall sensors. With the aid of an ellipsoid function and the least squares method, only the output voltages of the six Hall sensors were required to decouple the six-DOF displacement and inclination of the motion platform with high accuracy. Finally, the experimental measurements demonstrate the effectiveness of the six DOF displacement measurement methodology, based on which the maximum errors of displacements can reach 0.23 mm and the maximum errors of inclinations can reach 0.07°.

Original languageEnglish
Article number2030
JournalSensors
Volume18
Issue number7
DOIs
StatePublished - Jul 2018
Externally publishedYes

Keywords

  • Displacement measurement
  • Ellipsoid function
  • Hall sensor
  • The least squares method

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