Abstract
A method is reported to simultaneously measure the nonlinear absorption and refraction coefficients of materials using a nonlinear-imaging technique with a phase object. In this technique, the sign and magnitude of both the nonlinear absorption and refraction can be acquired conveniently from the analysis of three experiment images: the linear image, the nonlinear image and the image without sample. In order to validate our approach, we demonstrate this method for ZnSe at 532 nm where two-photon absorption is present and the nonlinear refractive index n 2 is negative. The values of β (nonlinear absorption coefficient) and n 2 we measured are very close to the values found in other literature.
| Original language | English |
|---|---|
| Pages (from-to) | 1483-1490 |
| Number of pages | 8 |
| Journal | Science in China, Series E: Technological Sciences |
| Volume | 51 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 2008 |
Keywords
- 4f system
- Nonlinear absorption
- Nonlinear refraction
- Phase object
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