Simulation on the radiative transfer in infrared temperature measurement for semitransparent medium

Xue Chen; Feng Xian Sun; Xin Lin Xia; Chuang Sun

Simulation on the radiative transfer in infrared temperature measurement for semitransparent medium

Xue Chen
, Feng Xian Sun
, Xin Lin Xia^*
, Chuang Sun

^*Corresponding author for this work

School of Energy Science and Engineering, Harbin Institute of Technology
Harbin Engineering University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A radiative transfer model was developed for temperature measurement for semitransparent medium using infrared imager. Taking the reflection and emission of diffuse substrate and absorption and emission of medium into account, the radiation temperature was calculated with backward Monte Carlo method. The effects of geometric shape, emissivity of substrate ε_s and optical thickness τ were analyzed. The results show that obvious differences exist between opaque and semitransparent surfaces, radiation temperature of semitransparent medium increases with τ when ε_s < 1.0 and tends to the result of ε_s = 1.0 when τ ≥ 2, and complex or concave shape may affect the measurement results for both two types of surfaces due to the reflection of radiation.

Original language	English
Pages (from-to)	2032-2035
Number of pages	4
Journal	Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics
Volume	35
Issue number	10
State	Published - 1 Oct 2014
Externally published	Yes

Keywords

Backward Monte Carlo method
Infrared temperature measurement
Radiative transfer
Semitransparent medium layer

Cite this

@article{f393b857e49441af8481feecee961281,

title = "Simulation on the radiative transfer in infrared temperature measurement for semitransparent medium",

abstract = "A radiative transfer model was developed for temperature measurement for semitransparent medium using infrared imager. Taking the reflection and emission of diffuse substrate and absorption and emission of medium into account, the radiation temperature was calculated with backward Monte Carlo method. The effects of geometric shape, emissivity of substrate εs and optical thickness τ were analyzed. The results show that obvious differences exist between opaque and semitransparent surfaces, radiation temperature of semitransparent medium increases with τ when εs < 1.0 and tends to the result of εs = 1.0 when τ ≥ 2, and complex or concave shape may affect the measurement results for both two types of surfaces due to the reflection of radiation.",

keywords = "Backward Monte Carlo method, Infrared temperature measurement, Radiative transfer, Semitransparent medium layer",

author = "Xue Chen and Sun, \{Feng Xian\} and Xia, \{Xin Lin\} and Chuang Sun",

year = "2014",

month = oct,

day = "1",

language = "英语",

volume = "35",

pages = "2032--2035",

journal = "Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics",

issn = "0253-231X",

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TY - JOUR

T1 - Simulation on the radiative transfer in infrared temperature measurement for semitransparent medium

AU - Chen, Xue

AU - Sun, Feng Xian

AU - Xia, Xin Lin

AU - Sun, Chuang

PY - 2014/10/1

Y1 - 2014/10/1

N2 - A radiative transfer model was developed for temperature measurement for semitransparent medium using infrared imager. Taking the reflection and emission of diffuse substrate and absorption and emission of medium into account, the radiation temperature was calculated with backward Monte Carlo method. The effects of geometric shape, emissivity of substrate εs and optical thickness τ were analyzed. The results show that obvious differences exist between opaque and semitransparent surfaces, radiation temperature of semitransparent medium increases with τ when εs < 1.0 and tends to the result of εs = 1.0 when τ ≥ 2, and complex or concave shape may affect the measurement results for both two types of surfaces due to the reflection of radiation.

AB - A radiative transfer model was developed for temperature measurement for semitransparent medium using infrared imager. Taking the reflection and emission of diffuse substrate and absorption and emission of medium into account, the radiation temperature was calculated with backward Monte Carlo method. The effects of geometric shape, emissivity of substrate εs and optical thickness τ were analyzed. The results show that obvious differences exist between opaque and semitransparent surfaces, radiation temperature of semitransparent medium increases with τ when εs < 1.0 and tends to the result of εs = 1.0 when τ ≥ 2, and complex or concave shape may affect the measurement results for both two types of surfaces due to the reflection of radiation.

KW - Backward Monte Carlo method

KW - Infrared temperature measurement

KW - Radiative transfer

KW - Semitransparent medium layer

UR - https://www.scopus.com/pages/publications/84908275951

M3 - 文章

AN - SCOPUS:84908275951

SN - 0253-231X

VL - 35

SP - 2032

EP - 2035

JO - Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics

JF - Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics

IS - 10

ER -

Simulation on the radiative transfer in infrared temperature measurement for semitransparent medium

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Keywords

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