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Simulation of radiation effects on hard borosilicate glass by low-energy protons

  • Qing Yan Wang*
  • , Hong Bin Geng
  • , Xing Ji Li
  • , Zhong Hua Zhang
  • , Shi Yu He
  • , De Zhuang Yang
  • *Corresponding author for this work
  • School of Astronautics, Harbin Institute of Technology
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

To obtain damage behaviors in hard borosilicate glass, proton-induced ionizing and nonionizing energy loss were calculated by using the SRIM Monte Carlo program. The result shows that for protons with the energy range of 40-200 keV, the main damage is limited to the surface of borosilicate glass, and the ionizing energy loss, with the peak position of 80 keV, is the main type of energy loss. The nonionizing energy loss increases with the decreasing of energy and induces the vacancy production of O, Si and B etc. Both vacancy distribution and phonon distribution, similar to the proton deposition, follow the property of Bragg-type curve. Both the ionizing energy loss and nonionizing energy loss by protons with the energy range of 40-200 keV can change the microstructure of hard borosilicate glass.

Original languageEnglish
Pages (from-to)7-11
Number of pages5
JournalHarbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology
Volume43
Issue number1
StatePublished - Jan 2011

Keywords

  • Borosilicate glass
  • Bragg-type curve
  • Energy loss
  • Proton irradiation
  • SRIM

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