Simulation of lock mode in two-stage magnetron

G. I. Churyumov; T. I. Frolova; K. M. Basrawi

Simulation of lock mode in two-stage magnetron

G. I. Churyumov^*
, T. I. Frolova
, K. M. Basrawi

^*Corresponding author for this work

Kharkiv National University of Radio Electronics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The computer modeling of lock mode in the two-stage magnetrons is presented On the basis of comparing the obtained outcomes the advantages of application of the lock mode in the two-stage magnetron are shown.

Original language	English
Title of host publication	2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006
Pages	243-244
Number of pages	2
State	Published - 2006
Externally published	Yes
Event	2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006 - Monterey, CA, United States Duration: 25 Apr 2006 → 27 Apr 2006

Publication series

Name	2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006

Conference

Conference	2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006
Country/Territory	United States
City	Monterey, CA
Period	25/04/06 → 27/04/06

Keywords

Computer modeling
Electromagnetic wave
Electron beam
Locking
Magnetron
Waveform

Cite this

Churyumov, G. I., Frolova, T. I., & Basrawi, K. M. (2006). Simulation of lock mode in two-stage magnetron. In 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006 (pp. 243-244). Article 1666275 (2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006).

Churyumov, G. I. ; Frolova, T. I. ; Basrawi, K. M. / Simulation of lock mode in two-stage magnetron. 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006. 2006. pp. 243-244 (2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006).

@inproceedings{a063defd648b4327a558b0c8aaa14c42,

title = "Simulation of lock mode in two-stage magnetron",

abstract = "The computer modeling of lock mode in the two-stage magnetrons is presented On the basis of comparing the obtained outcomes the advantages of application of the lock mode in the two-stage magnetron are shown.",

keywords = "Computer modeling, Electromagnetic wave, Electron beam, Locking, Magnetron, Waveform",

author = "Churyumov, \{G. I.\} and Frolova, \{T. I.\} and Basrawi, \{K. M.\}",

year = "2006",

language = "英语",

isbn = "1424401089",

series = "2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006",

pages = "243--244",

booktitle = "2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006",

note = "2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006 ; Conference date: 25-04-2006 Through 27-04-2006",

}

Churyumov, GI, Frolova, TI & Basrawi, KM 2006, Simulation of lock mode in two-stage magnetron. in 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006., 1666275, 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006, pp. 243-244, 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006, Monterey, CA, United States, 25/04/06.

Simulation of lock mode in two-stage magnetron. / Churyumov, G. I.; Frolova, T. I.; Basrawi, K. M.
2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006. 2006. p. 243-244 1666275 (2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Simulation of lock mode in two-stage magnetron

AU - Churyumov, G. I.

AU - Frolova, T. I.

AU - Basrawi, K. M.

PY - 2006

Y1 - 2006

N2 - The computer modeling of lock mode in the two-stage magnetrons is presented On the basis of comparing the obtained outcomes the advantages of application of the lock mode in the two-stage magnetron are shown.

AB - The computer modeling of lock mode in the two-stage magnetrons is presented On the basis of comparing the obtained outcomes the advantages of application of the lock mode in the two-stage magnetron are shown.

KW - Computer modeling

KW - Electromagnetic wave

KW - Electron beam

KW - Locking

KW - Magnetron

KW - Waveform

UR - https://www.scopus.com/pages/publications/34249699057

M3 - 会议稿件

AN - SCOPUS:34249699057

SN - 1424401089

SN - 9781424401086

T3 - 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006

SP - 243

EP - 244

BT - 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006

T2 - 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006

Y2 - 25 April 2006 through 27 April 2006

ER -

Churyumov GI, Frolova TI, Basrawi KM. Simulation of lock mode in two-stage magnetron. In 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006. 2006. p. 243-244. 1666275. (2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006).

Simulation of lock mode in two-stage magnetron

Abstract

Publication series

Conference

Keywords

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Cite this