@inproceedings{6dcf4e9ba7ea4144b9aa316005ae59b8,
title = "Simulation and Verification of Impact Resistance of Separation and Detachment Connectors for Aerospace Applications",
abstract = "A digital model-based analysis and verification method for the impact resistance performance of key components of separation and detachment connectors is proposed to address the common failure issues in aerospace applications. Taking a certain type of separation and detachment connector as the research object, after in-depth understanding of the connector{\textquoteright}s function and structure, and analyzing the failure mechanism of its detachable locking mechanism, the key failure modes are determined. The method involves using digital models to simulate the connector{\textquoteright}s unlocking process by establishing high-precision 3D models and performing finite element simulation analysis. The stress levels experienced by key components during unlocking were analyzed. Furthermore, verification experiments were designed to validate the stress simulation results.",
keywords = "Digital models, Impact resistance performance, Separation and detachment connectors",
author = "Xuerong Ye and Shanxue Zhao and Hao Chen",
note = "Publisher Copyright: {\textcopyright} Beijing Paike Culture Commu. Co., Ltd. 2026.; 20th Annual Conference of China Electrotechnical Society, ACCES 2025 ; Conference date: 19-09-2025 Through 21-09-2025",
year = "2026",
doi = "10.1007/978-981-95-7652-4\_22",
language = "英语",
isbn = "9789819576517",
series = "Lecture Notes in Electrical Engineering",
publisher = "Springer Science and Business Media Deutschland GmbH",
pages = "195--203",
editor = "Qingxin Yang and Dianguo Xu and Xuerong Ye and Qiuyue Nie and Yueshi Guan",
booktitle = "The Proceedings of the 20th Annual Conference of China Electrotechnical Society",
address = "德国",
}