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Simulation and analysis of far-field single-photon response model in Geiger avalanche mode

  • Hengchang Ou
  • , Le Ma
  • , Peng Jiang*
  • , Pengfei Wang
  • , Jie Lu
  • , Xin Zhou
  • , Jianfeng Sun
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Science and Technology on Complex System Control and Intelligent Agent Cooperation Laboratory
  • Beijing Institute of Remote Sensing
  • China Electronics Technology Group Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Poisson distribution model is the basis of data analysis for GM-APD lidar, but it is only applicable to the mirror reflected target under ideal conditions, and cannot accurately describe the photon triggering process of actual GM-APD lidar detection. For the actual target with rough surface, the negative binomial distribution with M as the parameter can describe the photon distribution model more accurately. In order to solve this problem, this paper compares and analyzes Poisson distribution triggering model and the negative binomial distribution triggering model that conforms to the triggering situation of the echo signal of the target with rough surface, considering the differences in the triggering probability under different noise and signal levels. The results show that the trigger probability curve corresponding to the trigger model based on negative binomial distribution is lower in peak value, wider in bottom value and fatter overall than that of the trigger model based on Poisson distribution, and the difference between the two is more prominent under the conditions of low noise level and high signal level. This study has guiding significance for the signal extraction research based on different surface echoes.

Original languageEnglish
Title of host publicationSeventh Global Intelligent Industry Conference, GIIC 2024
EditorsXingjun Wang
PublisherSPIE
ISBN (Electronic)9781510682986
DOIs
StatePublished - 2024
Event7th Global Intelligent Industry Conference, GIIC 2024 - Shenzhen, China
Duration: 30 Mar 20241 Apr 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13278
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference7th Global Intelligent Industry Conference, GIIC 2024
Country/TerritoryChina
CityShenzhen
Period30/03/241/04/24

Keywords

  • Gm-APD
  • Negative binomial distribution
  • Poisson distribution
  • Trigger probability

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