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Similarity measurement for off-line signature verification

  • Xinge You*
  • , Bin Fang
  • , Zhenyu He
  • , Yuanyan Tang
  • *Corresponding author for this work
  • Hubei University
  • Hong Kong Baptist University
  • Chongqing University

Research output: Contribution to journalConference articlepeer-review

Abstract

Existing methods to deal with off-line signature verification usually adopt the feature representation based approaches which suffer from limited training samples. It is desired to employ straightforward means to measure similarity between 2-D static signature graphs. In this paper, we incorporate merits of both global and local alignment methods. Two signature patterns are globally registered using weak affine transformation and correspondences of feature points between two signature patterns are determined by applying an elastic local alignment algorithm. Similarity is measured as the mean square of sum Euclidean distances of all found corresponding feature points based on a match list. Experimental results showed that the computed similarity measurement was able to provide sufficient discriminatory information. Verification performance in terms of equal error rate was 18.6% with four training samples.

Original languageEnglish
Pages (from-to)272-281
Number of pages10
JournalLecture Notes in Computer Science
Volume3644
Issue numberPART I
DOIs
StatePublished - 2005
Externally publishedYes
Event1st International Conference on Intelligent Computing, ICIC 2005 - Hefei, China
Duration: 23 Aug 200526 Aug 2005

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