TY - GEN
T1 - Sensor fault diagnosis based on on-line random forests
AU - Yang, Li
AU - Zhang, Jia
AU - Deng, Fang
AU - Chen, Jie
N1 - Publisher Copyright:
© 2016 TCCT.
PY - 2016/8/26
Y1 - 2016/8/26
N2 - In order to reduce the memory requirement, and obtain real-time status of equipment, the paper proposed to use the the on-line random forests (ORFs) algorithm to identify sensor fault. The sample set is derived from Tennessee Eastman (TE) process. The models are updated by a group of sensor data, which are collected in each interval. As models are real-time and dynamic, the equipment could be tested at any time. Moreover, the samples obtained at previous intervals are not need to store. The results of experiments show that the accuracies of ORFs and Random Forests (RFs) are similar in sensor fault diagnosis process. And in some fast changing process, ORFs distinguishes fault types with higher accuracy, better adaptable and faster than RFs.
AB - In order to reduce the memory requirement, and obtain real-time status of equipment, the paper proposed to use the the on-line random forests (ORFs) algorithm to identify sensor fault. The sample set is derived from Tennessee Eastman (TE) process. The models are updated by a group of sensor data, which are collected in each interval. As models are real-time and dynamic, the equipment could be tested at any time. Moreover, the samples obtained at previous intervals are not need to store. The results of experiments show that the accuracies of ORFs and Random Forests (RFs) are similar in sensor fault diagnosis process. And in some fast changing process, ORFs distinguishes fault types with higher accuracy, better adaptable and faster than RFs.
KW - On-line Random Forests
KW - Sensor fault
KW - Tennessee Eastman process
UR - https://www.scopus.com/pages/publications/84987905638
U2 - 10.1109/ChiCC.2016.7553992
DO - 10.1109/ChiCC.2016.7553992
M3 - 会议稿件
AN - SCOPUS:84987905638
T3 - Chinese Control Conference, CCC
SP - 4089
EP - 4093
BT - Proceedings of the 35th Chinese Control Conference, CCC 2016
A2 - Chen, Jie
A2 - Zhao, Qianchuan
A2 - Chen, Jie
PB - IEEE Computer Society
T2 - 35th Chinese Control Conference, CCC 2016
Y2 - 27 July 2016 through 29 July 2016
ER -