Skip to main navigation Skip to search Skip to main content

Semi-supervised Graph Anomaly Detection via Multi-view Contrastive Learning

  • Hengji Dong
  • , Jing Zhao
  • , Hongwei Yang
  • , Hui He*
  • , Jun Zhou
  • , Yunqing Feng
  • , Yangyiye Jin
  • , Rui Liu
  • , Mengge Wang
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Shanghai Pudong Development Bank Co., Ltd.

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Graph anomaly detection aims to identify the abnormal nodes in a graph that deviate from the majority of nodes, which is critical in fields such as finance and social network analysis. Due to the unbearable costs of labeling anomalies, existing methods are mainly tackled from unsupervised or semi-supervised manners. Unfortunately, most proposed methods either lack prior knowledge of the anomalies or neglect the potential relation between labeled and unlabeled nodes, with limited improvement. In this paper, we propose a novel Semi-supervised learning framework for graph Anomaly Detection via Multi-view Contrastive Learning (SADMCL for abbreviation), which uses very few labels to promote detection performance. To be specific, we employ multi-view contrastive learning, i.e., sample-sample contrast, sample-instance contrast, and normal-anomaly contrast, to generate the representations with significant discrimination between normal and abnormal nodes, as well as the instances that respond to the normal features. By comparing the learned representations and the instances, we comprehensively calculate the anomaly score for each node and infer its label. Extensive experiments conducted on four real-world datasets demonstrate that our approach outperforms current state-of-the-art anomaly detection algorithms when provided with few labeled samples.

Original languageEnglish
Title of host publication2024 International Joint Conference on Neural Networks, IJCNN 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350359312
DOIs
StatePublished - 2024
Event2024 International Joint Conference on Neural Networks, IJCNN 2024 - Yokohama, Japan
Duration: 30 Jun 20245 Jul 2024

Publication series

NameProceedings of the International Joint Conference on Neural Networks

Conference

Conference2024 International Joint Conference on Neural Networks, IJCNN 2024
Country/TerritoryJapan
CityYokohama
Period30/06/245/07/24

Keywords

  • Anomaly detection
  • Attributed graph
  • Contrastive learning
  • Semi-supervised learning

Fingerprint

Dive into the research topics of 'Semi-supervised Graph Anomaly Detection via Multi-view Contrastive Learning'. Together they form a unique fingerprint.

Cite this