Self-Recovery Tolerance Latch Design Based on the Radiation Mechanism

Digital latches are becoming more sensitive to Multiple-Node Upsets (MNUs) due to lower supply voltage and higher integration density of devices. The hardening technique based on using multiple C-Elements (CEs) (the CE acts as an inverter if its inputs are equal to each other, otherwise holds the high-impedance output) has been used to propose the MNU tolerance latches. However, it brings important hardware overheads. Based on the radiation mechanism, this paper proposes an MNU tolerance latch with self-recovery properties to prevent Singe Node Upset (SNU) and MNU propagation in the feedback loops, and providing the smallest overheads in terms of power, delay, rising time $\text{t}_{\mathrm {r}}$ , falling time $\text{t}_{\mathrm {f}}$ and Power-Delay-Area-Product (PDAP) metric compared with the existing MNU tolerance latches.