Abstract
Self-powered broadband photodetectors are critical for energy-efficient optoelectronics in the Internet of Things, environmental sensing, and wearable imaging, yet achieving broadband response with high specific detectivity in a device through a scalable fabrication method remains a major challenge. In this work, we report a Bi2Te3/GaN heterojunctionphotodetector that integrates narrow- and wide-bandgap semiconductors to realize self-powered operation from ultraviolet to near infrared region. The Bi2Te3/GaN heterostructure is fabricated by depositing a homogeneous Bi2Te3 film with high crystallinity on a GaN substrate through the electron beam evaporation method followed by a post-annealing. Without any external bias, the photodetector exhibits a broadband specific detectivity above 109 Jones and a fast response lower than 100 m s in the 367-850 nm spectral range, attributed to efficient photogenerated carrier separation across the heterojunctiondue to the built-in electric field at the interface. Under 367 nm light irradiation, the device achieves a responsivity of 80.39 mA/W and a specific detectivity of 2.01 × 1012 Jones. The device also demonstrates excellent cycling durability, maintaining stable photoresponse over 100 cycles at 638 nm illumination, and supports high-resolution and multi-wavelength imaging. This work provides a cost-effective, scalable strategy for constructing Bi2Te3/GaN heterojunctions and highlights the potential of Bi2Te3-based detectors for next-generation self-powered broadband photodetection technologies.
| Original language | English |
|---|---|
| Article number | 100833 |
| Journal | Materials Today Nano |
| Volume | 34 |
| DOIs | |
| State | Published - Jun 2026 |
| Externally published | Yes |
Keywords
- BiTe/GaN heterojunction
- Broadband photodetection
- Image sensing
- Self-powered photodetector
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