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Second-order attention network for single image super-resolution

  • Tao Dai
  • , Jianrui Cai
  • , Yongbing Zhang
  • , Shu Tao Xia
  • , Lei Zhang*
  • *Corresponding author for this work
  • Tsinghua University
  • Peng Cheng Laboratory
  • Hong Kong Polytechnic University
  • Alibaba Group Holding Ltd.

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recently, deep convolutional neural networks (CNNs) have been widely explored in single image super-resolution (SISR) and obtained remarkable performance. However, most of the existing CNN-based SISR methods mainly focus on wider or deeper architecture design, neglecting to explore the feature correlations of intermediate layers, hence hindering the representational power of CNNs. To address this issue, in this paper, we propose a second-order attention network (SAN) for more powerful feature expression and feature correlation learning. Specifically, a novel train-able second-order channel attention (SOCA) module is developed to adaptively rescale the channel-wise features by using second-order feature statistics for more discriminative representations. Furthermore, we present a non-locally enhanced residual group (NLRG) structure, which not only incorporates non-local operations to capture long-distance spatial contextual information, but also contains repeated local-source residual attention groups (LSRAG) to learn increasingly abstract feature representations. Experimental results demonstrate the superiority of our SAN network over state-of-the-art SISR methods in terms of both quantitative metrics and visual quality.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019
PublisherIEEE Computer Society
Pages11057-11066
Number of pages10
ISBN (Electronic)9781728132938
DOIs
StatePublished - Jun 2019
Externally publishedYes
Event32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019 - Long Beach, United States
Duration: 16 Jun 201920 Jun 2019

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2019-June
ISSN (Print)1063-6919

Conference

Conference32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019
Country/TerritoryUnited States
CityLong Beach
Period16/06/1920/06/19

Keywords

  • Deep Learning
  • Low-level Vision

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