Scaling into ambient intelligence

Twan Basten; Luca Benini; Anantha Chandrakasan; Menno Lindwer; Jie Liu; Rex Min; Feng Zhao

doi:10.1109/DATE.2003.1253590

Scaling into ambient intelligence

Twan Basten
, Luca Benini
, Anantha Chandrakasan
, Menno Lindwer
, Jie Liu
, Rex Min
, Feng Zhao

Eindhoven University of Technology
University of Bologna
Massachusetts Institute of Technology
Koninklijke Philips N.V.
Palo Alto Research Center

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

17 Scopus citations

Abstract

Envision the situation that high quality information and entertainment is easily accessible to anyone, anywhere, at any time, and on any device. How realistic is this vision? And what does it require from the underlying technology? Ambient Intelligence (AmI) integrates concepts ranging from ubiquitous computing to autonomous and intelligent systems. An AmI environment will be highly dynamic in many aspects. Underlying technology must be very flexible to cope with this dynamism. The scalability of technology is only one crucial aspect. This paper explores scalability from the processing, the communication, and the software perspectives.

Original language	English
Title of host publication	Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2003
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	76-81
Number of pages	6
ISBN (Print)	0769518702
DOIs	https://doi.org/10.1109/DATE.2003.1253590
State	Published - 2003
Externally published	Yes
Event	2003 Design, Automation and Test in Europe Conference and Exhibition, DATE 2003 - Munich, Germany Duration: 3 Mar 2003 → 7 Mar 2003

Publication series

Name	Proceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)	1530-1591

Conference

Conference	2003 Design, Automation and Test in Europe Conference and Exhibition, DATE 2003
Country/Territory	Germany
City	Munich
Period	3/03/03 → 7/03/03

Access to Document

10.1109/DATE.2003.1253590

Cite this

Basten, T., Benini, L., Chandrakasan, A., Lindwer, M., Liu, J., Min, R., & Zhao, F. (2003). Scaling into ambient intelligence. In Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2003 (pp. 76-81). Article 1253590 (Proceedings -Design, Automation and Test in Europe, DATE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DATE.2003.1253590

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title = "Scaling into ambient intelligence",

abstract = "Envision the situation that high quality information and entertainment is easily accessible to anyone, anywhere, at any time, and on any device. How realistic is this vision? And what does it require from the underlying technology? Ambient Intelligence (AmI) integrates concepts ranging from ubiquitous computing to autonomous and intelligent systems. An AmI environment will be highly dynamic in many aspects. Underlying technology must be very flexible to cope with this dynamism. The scalability of technology is only one crucial aspect. This paper explores scalability from the processing, the communication, and the software perspectives.",

author = "Twan Basten and Luca Benini and Anantha Chandrakasan and Menno Lindwer and Jie Liu and Rex Min and Feng Zhao",

year = "2003",

doi = "10.1109/DATE.2003.1253590",

language = "英语",

isbn = "0769518702",

series = "Proceedings -Design, Automation and Test in Europe, DATE",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "76--81",

booktitle = "Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2003",

address = "美国",

note = "2003 Design, Automation and Test in Europe Conference and Exhibition, DATE 2003 ; Conference date: 03-03-2003 Through 07-03-2003",

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Basten, T, Benini, L, Chandrakasan, A, Lindwer, M, Liu, J, Min, R & Zhao, F 2003, Scaling into ambient intelligence. in Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2003., 1253590, Proceedings -Design, Automation and Test in Europe, DATE, Institute of Electrical and Electronics Engineers Inc., pp. 76-81, 2003 Design, Automation and Test in Europe Conference and Exhibition, DATE 2003, Munich, Germany, 3/03/03. https://doi.org/10.1109/DATE.2003.1253590

Scaling into ambient intelligence. / Basten, Twan; Benini, Luca; Chandrakasan, Anantha et al.
Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2003. Institute of Electrical and Electronics Engineers Inc., 2003. p. 76-81 1253590 (Proceedings -Design, Automation and Test in Europe, DATE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Scaling into ambient intelligence

AU - Basten, Twan

AU - Benini, Luca

AU - Chandrakasan, Anantha

AU - Lindwer, Menno

AU - Liu, Jie

AU - Min, Rex

AU - Zhao, Feng

PY - 2003

Y1 - 2003

N2 - Envision the situation that high quality information and entertainment is easily accessible to anyone, anywhere, at any time, and on any device. How realistic is this vision? And what does it require from the underlying technology? Ambient Intelligence (AmI) integrates concepts ranging from ubiquitous computing to autonomous and intelligent systems. An AmI environment will be highly dynamic in many aspects. Underlying technology must be very flexible to cope with this dynamism. The scalability of technology is only one crucial aspect. This paper explores scalability from the processing, the communication, and the software perspectives.

AB - Envision the situation that high quality information and entertainment is easily accessible to anyone, anywhere, at any time, and on any device. How realistic is this vision? And what does it require from the underlying technology? Ambient Intelligence (AmI) integrates concepts ranging from ubiquitous computing to autonomous and intelligent systems. An AmI environment will be highly dynamic in many aspects. Underlying technology must be very flexible to cope with this dynamism. The scalability of technology is only one crucial aspect. This paper explores scalability from the processing, the communication, and the software perspectives.

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U2 - 10.1109/DATE.2003.1253590

DO - 10.1109/DATE.2003.1253590

M3 - 会议稿件

AN - SCOPUS:21244441267

SN - 0769518702

T3 - Proceedings -Design, Automation and Test in Europe, DATE

SP - 76

EP - 81

BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2003

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2003 Design, Automation and Test in Europe Conference and Exhibition, DATE 2003

Y2 - 3 March 2003 through 7 March 2003

ER -

Scaling into ambient intelligence

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