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Robust Test-Time Adaptation for Single Image Denoising Using Deep Gaussian Prior

  • Qing Ma
  • , Pengwei Liang
  • , Xiong Zhou
  • , Jiayi Ma
  • , Junjun Jiang*
  • , Zhe Peng*
  • *Corresponding author for this work
  • Hong Kong Polytechnic University
  • Harbin Institute of Technology
  • Sixie Capital
  • Wuhan University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Gaussian denoising often serves as the initiation of research in the field of image denoising, owing to its prevalence and intriguing properties. However, deep Gaussian denoiser typically generalizes poorly to other types of noises, such as Poisson noise and real-world noise. In this paper, we reveal that deep Gaussian denoisers have an underlying ability to handle other noises with only ten iterations of self-supervised learning, which is referred to as deep denoiser prior. Specifically, we first pre-train a Gaussian denoising model in a self-supervised manner. Then, for each test image, we construct a pixel bank based on the self-similarity and randomly sample pseudo-instance examples from it to perform test-time adaptation. Finally, we fine-tune the pre-trained Gaussian denoiser using the randomly sampled pseudo-instances. Extensive experiments demonstrate that our test-time adaptation method helps the pre-trained Gaussian denoiser rapidly improve performance in removing both in-distribution and out-ofdistribution noise, achieving superior performance compared to existing single-image denoising methods while also significantly reducing computational time. Code available at: https://github.com/qingma2016/TTAD.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages11230-11240
Number of pages11
ISBN (Electronic)9798331587758
DOIs
StatePublished - 2025
Event2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Honolulu, United States
Duration: 19 Oct 202523 Oct 2025

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499
ISSN (Electronic)2380-7504

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
Country/TerritoryUnited States
CityHonolulu
Period19/10/2523/10/25

Keywords

  • image denoising
  • test-time adaptation

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