Abstract
With the continuous popularization and application of high-power RF microwave devices and the rapid development of wireless communication market, traditional small-signal S-parameter linear system theory can neither continue to support efficient and fast R & D of the RF electronic products with high-power, high-efficiency, complex spectrum and ultra-wideband, nor meet the urgent requirements of precise characterization, modeling, simulation, design and application for wireless front-end systems, such as RF power amplifier, mixer, modem, oscillator and other components. The vectorial measurement-based nonlinear parametric behavioral modeling technology for RF/microwave device is proposed under this background. This paper firstly describes the development background and urgency of nonlinear device characterization technology; then introduces the principles of two gradually matured vectorial measurement schemes and core technologies; and analyzes and compares the advantage and disadvantage of the two schemes. Finally, the mathematical formats of three nonlinear parametric mathematical behavioral models are deduced emphatically, and the parameter extraction methods and application examples are presented. Besides, the future development direction of the nonlinear behavior modeling technique based on vectorial measurements is also forecasted in this paper.
| Original language | English |
|---|---|
| Pages (from-to) | 1319-1329 |
| Number of pages | 11 |
| Journal | Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument |
| Volume | 34 |
| Issue number | 6 |
| State | Published - Jun 2013 |
| Externally published | Yes |
Keywords
- Nonlinear characterization
- Parametric behavior model
- Vectorial measurement
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