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Resonant excitation x-ray fluorescence from C60

  • J. H. Guo*
  • , P. Glans
  • , P. Skytt
  • , N. Wassdahl
  • , J. Nordgren
  • , Y. Luo
  • , H. Gren
  • , Y. Ma
  • , T. Warwick
  • , P. Heimann
  • , E. Rotenberg
  • , J. D. Denlinger
  • *Corresponding author for this work
  • Uppsala University
  • Linköping University
  • University of Washington
  • Pacific Northwest National Laboratory
  • Lawrence Berkeley National Laboratory
  • University of Oregon
  • University of Wisconsin-Milwaukee

Research output: Contribution to journalArticlepeer-review

Abstract

X-ray fluorescence of condensed C60 has been recorded in high resolution using monochromatic synchrotron radiation excitation. Strong intensity modulation of constituent spectral features is observed with varying excitation energy up to 10 eV above threshold. The energy dependence is interpreted as due to resonant inelastic x-ray scattering, leading to symmetry selection rules governing the two-photon process in the fully symmetric molecule.

Original languageEnglish
Pages (from-to)10681-10684
Number of pages4
JournalPhysical Review B-Condensed Matter
Volume52
Issue number15
DOIs
StatePublished - 1995
Externally publishedYes

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