Resolution enhancement of total internal reflection microscopy via polarised scattering

This paper presents a novel approach for enhancing the resolution of label-free total internal reflection microscopy. This method leverages the directional difference of the sample polar scattering by capturing microscopic images under the illumination of evanescent waves propagating in various directions. By computing the high-order autocorrelation accumulation of these images at different angles, we achieved a 1.5-fold improvement in resolution while effectively reducing the distortion caused by laser speckles and image artefacts. This technique holds promise for long-term, noninvasive observation with enhanced resolution.