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Residual stress generation during constrained sintering of layered ceramic thin film structures

  • E. P. Busso*
  • , R. P. Travis
  • , L. Chandra
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

This work investigates the sintering kinetics and residual stresses which develop in thin layered ceramic structures when sintered on a rigid substrate. A continuum constitutive framework to model the evolution of the microstructure and stresses in the sintering layers under non-isothermal conditions is presented. The sintering model is used to investigate the constrained sintering behaviour of layered ceramic structures used in solid oxide fuel cells (SOFC). Samples of a 50 μm thick SOFC film were screen-printed on a fully dense yttria-stabilized zirconia substrate and then sintered at temperatures ranging from 1100 °C to 1300 °C. Measured values of relative density and average grain size are compared with model predictions. A correlation between residual stresses extracted from curvature measurements and analytical predictions revealed these stresses to have been mostly relieved during the subsequent cooling by microcrack formation.

Original languageEnglish
Pages (from-to)547-552
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume505
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1997 MRS Fall Meeting - Boston, MA, USA
Duration: 30 Nov 19974 Dec 1997

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