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Residual area maximum depth model of indentation size effect of nanoindentation hardness

  • Liang Zhou*
  • , Yingxue Yao
  • , A. P. Shahjada
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

In order to research the indentation size effect (ISE) in the material nanoindentation hardness test, a single silicon crystal was used in nanoindentation experiments to get maximum depths. Combining Matlab software and the 3 dimensional morphology of nanoindentation obtained by an atomic force microscopy (AFM), the real residual areas were obtained. Based on the maximum depth and the residual area, a new model-residual area maximum depth model is proposed for indentation size effect on nanoindentation hardness. The model can understand and describe ISE in nanoindentation hardness better than other models.

Original languageEnglish
Pages (from-to)817-821
Number of pages5
JournalKuei Suan Jen Hsueh Pao/Journal of the Chinese Ceramic Society
Volume33
Issue number7
StatePublished - Jul 2005

Keywords

  • Atomic force microscopy
  • Hardness
  • Indentation size effect
  • Residual area maximum depth model
  • Single crystal silicon

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