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Research on ultrasonic longitudinal critical refraction wave stress measurement method based on the influence of separation temperature and coupling layer thickness

  • Enxiao Liu
  • , Meng Zhang
  • , Wenhao Gu
  • , Youfan Song*
  • , Dawei Wang
  • , Jinyu Tong
  • , Zhibin Li
  • , Yongmeng Liu
  • *Corresponding author for this work
  • Anhui University of Technology
  • Modern Precision Measurement and Laser Nondestructive Testing Key Laboratory of Fujian University
  • Harbin Institute of Technology
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The accurate measurement of stress in steel structures is critical for the stable operation of high-end equipment. Currently, the coupling mechanism of temperature and the coupling layer in ultrasonic stress measurement remains unclear. This paper proposes a novel method for ultrasonic longitudinal critically refracted wave (LCR) stress precision measurement based on acoustic time difference and waveform index. By precisely controlling temperature and coupling layer thickness, the individual and combined effects of these two factors on the acoustic time difference and waveform index of LCR waves were investigated. Mathematical relationships between the acoustic time difference and waveform index, and the temperature and coupling layer thickness were established, with coefficients of determination reaching 0.999. This method enables the accurate separation and calculation of temperature and coupling layer thickness values. This lays a theoretical foundation for the accurate separation of the effects of temperature and coupling layer thickness on stress measurement. Subsequently, by precisely applying stress ranging from 50 MPa to 400 MPa in stages to both sides of the specimen, a mathematical model relating acoustic time difference to temperature, coupling layer thickness, and stress was established. This allowed for the separation of measurement errors induced by temperature and coupling layer thickness, thereby achieving precise stress measurement. The relative error between the stress values obtained by this method and the actual stress values is less than 3%. This study provides a theoretical foundation and a high-precision solution for the stress measurement of key equipment.

Original languageEnglish
Article number122740
JournalMeasurement: Journal of the International Measurement Confederation
Volume290
DOIs
StatePublished - 15 Nov 2026

Keywords

  • Coupling layer thickness
  • Longitudinal critical refraction wave
  • Stress measurement
  • Temperature

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