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Research on transient model of IGBT

  • Xianhui Zhu*
  • , Shumei Cui
  • , Nan Shi
  • , Shuo Zhang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Electromagnetic interference problem caused by fast voltage/current rate of switching components becomes more and more seriously, which effects electromagnetic compatibility of devices greatly. It is necessary to build the transient model of switching devices. In this paper, a simple method of IGBT modeling is proposed, which depends on the data provided by chip manual, without the requirements of complex experimental test. The model are verified by the comparison of simulation and experiment results in time and frequency domain, the consistence of which reveals the validity of the model under the frequency of conduction.

Original languageEnglish
Title of host publicationAPPEEC 2012 - 2012 Asia-Pacific Power and Energy Engineering Conference, Proceedings
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 Asia-Pacific Power and Energy Engineering Conference, APPEEC 2012 - Shanghai, China
Duration: 27 Mar 201229 Mar 2012

Publication series

NameAsia-Pacific Power and Energy Engineering Conference, APPEEC
ISSN (Print)2157-4839
ISSN (Electronic)2157-4847

Conference

Conference2012 Asia-Pacific Power and Energy Engineering Conference, APPEEC 2012
Country/TerritoryChina
CityShanghai
Period27/03/1229/03/12

Keywords

  • EMI
  • IGBT
  • modeling of Proposed
  • transient

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