TY - GEN
T1 - Research on the Learning Method of Wiener Process Degradation Trajectory of Electromagnetic Relay Contact Arc Energy Based on Variational Autoencoder
AU - Deng, Jie
AU - Wang, Bing
AU - Mei, Fabin
AU - Zhai, Guofu
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - The contacts of electromagnetic relays, as the key components responsible for current interruption, inevitably suffer from performance degradation due to electrical arc erosion during operation. Most existing research on relay contacts has focused on the performance degradation of contact resistance while neglecting the variations in arc energy during the breaking and closing processes. The magnitude of arc energy directly reflects the intensity of arc erosion on the contacts and serves as a critical parameter. Therefore, this paper models the drift Wiener process of arc energy sequences during contact breaking and closing using a variational autoencoder model based on contact arc energy. This approach captures the degradation process of contact arc energy and enables the lifetime prediction of electromagnetic relays.
AB - The contacts of electromagnetic relays, as the key components responsible for current interruption, inevitably suffer from performance degradation due to electrical arc erosion during operation. Most existing research on relay contacts has focused on the performance degradation of contact resistance while neglecting the variations in arc energy during the breaking and closing processes. The magnitude of arc energy directly reflects the intensity of arc erosion on the contacts and serves as a critical parameter. Therefore, this paper models the drift Wiener process of arc energy sequences during contact breaking and closing using a variational autoencoder model based on contact arc energy. This approach captures the degradation process of contact arc energy and enables the lifetime prediction of electromagnetic relays.
KW - Degradation Modeling
KW - Electromagnetic Relay
KW - Variational Autoencoder
KW - Wiener process
UR - https://www.scopus.com/pages/publications/105032883716
U2 - 10.1109/SRSE67406.2025.11357425
DO - 10.1109/SRSE67406.2025.11357425
M3 - 会议稿件
AN - SCOPUS:105032883716
T3 - 2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
SP - 34
EP - 38
BT - 2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
Y2 - 20 November 2025 through 23 November 2025
ER -