Research on the condition parameter tester of high voltage circuit breakers

Xiaoguang Hu; Chao Lv

doi:10.1109/ICIEA.2008.4582945

Research on the condition parameter tester of high voltage circuit breakers

Xiaoguang Hu^*
, Chao Lv

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

18 Scopus citations

Abstract

In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.

Original language	English
Title of host publication	2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
Pages	2389-2393
Number of pages	5
DOIs	https://doi.org/10.1109/ICIEA.2008.4582945
State	Published - 2008
Externally published	Yes
Event	2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008 - Singapore, Singapore Duration: 3 Jun 2008 → 5 Jun 2008

Publication series

Name	2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008

Conference

Conference	2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
Country/Territory	Singapore
City	Singapore
Period	3/06/08 → 5/06/08

Access to Document

10.1109/ICIEA.2008.4582945

Cite this

@inproceedings{4c9bfc484f974583a6e5d413c8de9042,

title = "Research on the condition parameter tester of high voltage circuit breakers",

abstract = "In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.",

author = "Xiaoguang Hu and Chao Lv",

year = "2008",

doi = "10.1109/ICIEA.2008.4582945",

language = "英语",

isbn = "9781424417186",

series = "2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008",

pages = "2389--2393",

booktitle = "2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008",

note = "2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008 ; Conference date: 03-06-2008 Through 05-06-2008",

}

Hu, X & Lv, C 2008, Research on the condition parameter tester of high voltage circuit breakers. in 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008., 4582945, 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008, pp. 2389-2393, 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008, Singapore, Singapore, 3/06/08. https://doi.org/10.1109/ICIEA.2008.4582945

Research on the condition parameter tester of high voltage circuit breakers. / Hu, Xiaoguang; Lv, Chao.
2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008. 2008. p. 2389-2393 4582945 (2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Research on the condition parameter tester of high voltage circuit breakers

AU - Hu, Xiaoguang

AU - Lv, Chao

PY - 2008

Y1 - 2008

N2 - In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.

AB - In order to improve the reliability of power system by condition-based maintenance of high voltage circuit breakers (HVCBs), a mechanical condition parameter tester of HVCBs is designed and developed. Almost all the parameters associated with closing resistance, coil current and contact travel distance can be measured by this tester. Diversity of acquisition is achieved with a distributed control mode. Advanced signal processing method, such as wavelet transformation and technologies, such as MCU, photoelectric encoder, CPLD and SD card are used. It has been proved that with this tester, accurate measurement of the condition parameters can be realized, and the cost of maintaining HVCBs is reduced.

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U2 - 10.1109/ICIEA.2008.4582945

DO - 10.1109/ICIEA.2008.4582945

M3 - 会议稿件

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SN - 9781424417186

T3 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008

SP - 2389

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BT - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008

T2 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008

Y2 - 3 June 2008 through 5 June 2008

ER -

Research on the condition parameter tester of high voltage circuit breakers

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