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Research on light intensity modulation within KDP crystal based on different width of Gaussian repaired contour of surface defects

  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Surface micro-defects of large diameter KDP crystal have great influence on its laser damage threshold. The method of micro-mechanical repairing can inhibit growth of the laser damage obviously. The paper adopts Fourier modal method to periodically process Gaussian repaired contour and established the light intensity modulation model of the Gaussian contour inside the crystal. Based on the model, the paper researches the influences on the light intensity inside the crystal made by Gaussian repaired contour with different width. Calculation results show that when the curve depth is fixed, the maximum relative light intensity decreases gradually as the curve width increases. Through experiments of micro-mechanical repairing and laser irradiation, we find that the laser damage threshold of Gaussian repaired contour with 20μm depth and 400μm width is 3ω, 5J/cm2. Meanwhile, experimental results verify the theoretical analysis.

Original languageEnglish
Title of host publicationPrecision Engineering and Nanotechnology V
PublisherTrans Tech Publications Ltd
Pages234-240
Number of pages7
ISBN (Print)9783038352112
DOIs
StatePublished - 2015
Event5th International Conference on Asian Society for Precision Engineering and Nanotechnology, ASPEN 2013 - Taipei, Taiwan, Province of China
Duration: 12 Nov 201315 Nov 2013

Publication series

NameKey Engineering Materials
Volume625
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Conference

Conference5th International Conference on Asian Society for Precision Engineering and Nanotechnology, ASPEN 2013
Country/TerritoryTaiwan, Province of China
CityTaipei
Period12/11/1315/11/13

Keywords

  • Fourier modal method
  • Gaussian repaired contour
  • Internal intensity modulation
  • KDP crystal
  • Surface defect

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