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Research on key technologies of quadrupole electromagnetic tweezer

  • He Ni
  • , Jingtao Li
  • , Limin Zou*
  • , Peng Zhang
  • , Xuemei Ding
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the quadrupole electromagnetic tweezer installed in a fluorescent microscope was developed for the purpose of achieving precise control of magnetic microspheres' motion trajectory. The key technologies of magnetic microsphere control and positioning by such quadrupole magnetic tweezers were systematically studied. An electromagnetic quadrupole magnetic tweezer system was designed and constructed, a current-magnetic force model of the quadrupole magnetic tweezer was established, and the magnetic force-current inverse force model was derived and simplified. A fluorescence microscopy imaging system was set up and the related program design was completed. The position of magnetic fluorescent microspheres was monitored by a high-speed CCD with sampling frequency of 200 Hz. A proportional-integral closedloop feedback controller was built up for magnetic microspheres. The experimental results demonstrated that the magnetic force range available at the center of the work area was [-80pN, 80pN]. Besides, magnetic microspheres were tested to possess a displacement resolution up to 400 nm as well as the capacity of moving in any direction in a two-dimensional plane. Based on the obtained results, it is expected that the quadrupole electromagnetic tweezer can function one of the effective devices for evaluation of cell mechanical properties.

Original languageEnglish
Title of host publicationTenth International Symposium on Precision Engineering Measurements and Instrumentation
EditorsJiubin Tan, Jie Lin
PublisherSPIE
ISBN (Electronic)9781510627819
DOIs
StatePublished - 2019
Event10th International Symposium on Precision Engineering Measurements and Instrumentation, ISPEMI 2018 - Kunming, China
Duration: 8 Aug 201810 Aug 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11053
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference10th International Symposium on Precision Engineering Measurements and Instrumentation, ISPEMI 2018
Country/TerritoryChina
CityKunming
Period8/08/1810/08/18

Keywords

  • Feedback control
  • Magnetic force
  • Magnetic microsphere
  • Magnetic poles
  • Magnetic tweezer

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