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Research on downhole multi-parameter comprehensive measurement of ESP

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In consideration of the complex condition of down hole environment, an ESP down hole multi-parameter comprehensive measurement system was designed in this paper in order to monitor the down hole information. Firstly, structures of the up hole section and down hole section of the system were introduced respectively. Then some key technologies on the system were illustrated in detail which consists of remote power supply, time-sharing multiplex transmission, analog current loop and error compensation. Finally, the reliability and accuracy of the system were demonstrated through a series of experiments.

Original languageEnglish
Title of host publicationProceedings - 2014 4th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2014
EditorsJun-Bao Li
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages346-350
Number of pages5
ISBN (Electronic)9781479965755
DOIs
StatePublished - 22 Dec 2014
Externally publishedYes
Event4th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2014 - Harbin, Heilongjiang, China
Duration: 18 Sep 201420 Sep 2014

Publication series

NameProceedings - 2014 4th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2014

Conference

Conference4th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2014
Country/TerritoryChina
CityHarbin, Heilongjiang
Period18/09/1420/09/14

Keywords

  • ESP
  • key technologies
  • monitor
  • structures

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