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Reliability study on thermal cycling of QFP device solder joints based on morphological optimisation

  • Harbin Institute of Technology
  • Beijing Aerospace Automatic Control Institute

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

As a research method with low cost and high accuracy, finite element simulation is widely used in various fields. However, there are still some difficulties in obtaining accurate initial model in some researches. In this paper, Surface Evolver software is used to calculate the initial solder joint model of QFP device by energy minimization principle, and the model is tested experimentally. Then, the solder joint model was imported into the finite element software to establish the QFP device model, and the thermal cycle simulation test at -55-150°C was carried out to obtain the mechanical properties of the solder joint. Finally, the fatigue life prediction model is used to calculate the life of solder joints.

Original languageEnglish
Title of host publication2024 25th International Conference on Electronic Packaging Technology, ICEPT 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350353808
DOIs
StatePublished - 2024
Event25th International Conference on Electronic Packaging Technology, ICEPT 2024 - Tianjin, China
Duration: 7 Aug 20249 Aug 2024

Publication series

Name2024 25th International Conference on Electronic Packaging Technology, ICEPT 2024

Conference

Conference25th International Conference on Electronic Packaging Technology, ICEPT 2024
Country/TerritoryChina
CityTianjin
Period7/08/249/08/24

Keywords

  • fatigue life
  • finite element simulation
  • solder joint
  • surface evolver

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