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Reliability issues of lead-free solder joints in electronic devices

  • Nan Jiang
  • , Liang Zhang*
  • , Zhi Quan Liu
  • , Lei Sun
  • , Wei Min Long
  • , Peng He
  • , Ming Yue Xiong
  • , Meng Zhao
  • *Corresponding author for this work
  • Jiangsu Normal University
  • Harbin Institute of Technology
  • CAS - Institute of Metal Research
  • Nanjing University of Aeronautics and Astronautics
  • Zhengzhou Research Institute of Mechanical Engineering

Research output: Contribution to journalReview articlepeer-review

Abstract

Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process, mostly due to the failure of solder joints. With the improvement of environmental protection awareness, lead-free solder joints have become a hot issue in recent years. This paper reviews the research progress on the reliability of lead-free solder joints and discusses the influence of temperature, vibration, tin whisker and electromigration on the reliability of solder joints. In addition, the measures to improve the reliability of solder joints are analyzed according to the problems of solder joints themselves, which provides a further theoretical basis for the study of the reliability of solder joints of electronic products in service.

Original languageEnglish
Pages (from-to)876-901
Number of pages26
JournalScience and Technology of Advanced Materials
Volume20
Issue number1
DOIs
StatePublished - 31 Dec 2019

Keywords

  • 103 Composites
  • 106 Metallic materials
  • 201 Electronics / Semiconductor / TCOs
  • 212 Surface and interfaces
  • 40 Optical, magnetic and electronic device materials
  • 503 TEM, STEM, SEM
  • IMC
  • Lead-free solder
  • crack
  • failure
  • reliability

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