TY - GEN
T1 - Reliability Evaluation and Functional Module Analysis of the Loose Particle Localization Model for Sealed Electronic Equipment
AU - Sun, Zhigang
AU - Xiao, Kaiwen
AU - Chen, Hao
AU - Wang, Guotao
AU - Liang, Bao
AU - Zhai, Guofu
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Existing research has constructed the loose particle localization model (LPLM) with excellent classification performance, achieving accurate data classification. However, the loose particle localization results have not been provided, and the construction process of the LPLM has not been comprehensively analyzed. Thus, the practicality of improving classification performance has not been comprehensively understood. Based on this, this article conducts reliability evaluation and functional module analysis of the LPLM. First, the essence of data classification in the LPLM is explored, and a majority voting process is added to achieve the conversion of data classification results to loose particle localization results. Thus, the role of the classification performance of the LPLM in the loose particle localization results is clearly demonstrated. Second, the construction process of the LPLM is comprehensively analyzed, and the impact of the five functional modules on classification performance is quantitatively evaluated and compared, with key functional modules highlighted. Therefore, the practicality of the LPLM is reasonably explained. The experimental results show that, when the classification accuracy achieved by the LPLM based on parameter-optimized XGBoost is stable above 0.53, accurate and reliable loose particle localization results can be obtained. Among them, 'pulse processing' and 'feature construction' are two key functional modules that have a significant impact on the classification performance of the LPLM, with performance degradation amplitudes of 0.1019 and 0.0964, respectively. They need to be taken seriously to maintain stable and excellent classification performance.
AB - Existing research has constructed the loose particle localization model (LPLM) with excellent classification performance, achieving accurate data classification. However, the loose particle localization results have not been provided, and the construction process of the LPLM has not been comprehensively analyzed. Thus, the practicality of improving classification performance has not been comprehensively understood. Based on this, this article conducts reliability evaluation and functional module analysis of the LPLM. First, the essence of data classification in the LPLM is explored, and a majority voting process is added to achieve the conversion of data classification results to loose particle localization results. Thus, the role of the classification performance of the LPLM in the loose particle localization results is clearly demonstrated. Second, the construction process of the LPLM is comprehensively analyzed, and the impact of the five functional modules on classification performance is quantitatively evaluated and compared, with key functional modules highlighted. Therefore, the practicality of the LPLM is reasonably explained. The experimental results show that, when the classification accuracy achieved by the LPLM based on parameter-optimized XGBoost is stable above 0.53, accurate and reliable loose particle localization results can be obtained. Among them, 'pulse processing' and 'feature construction' are two key functional modules that have a significant impact on the classification performance of the LPLM, with performance degradation amplitudes of 0.1019 and 0.0964, respectively. They need to be taken seriously to maintain stable and excellent classification performance.
KW - Classification performance
KW - Functional module analysis
KW - Loose particle localization
KW - Reliability evaluation
UR - https://www.scopus.com/pages/publications/105032892784
U2 - 10.1109/SRSE67406.2025.11357335
DO - 10.1109/SRSE67406.2025.11357335
M3 - 会议稿件
AN - SCOPUS:105032892784
T3 - 2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
SP - 252
EP - 258
BT - 2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
Y2 - 20 November 2025 through 23 November 2025
ER -