Skip to main navigation Skip to search Skip to main content

Reliability Evaluation and Functional Module Analysis of the Loose Particle Localization Model for Sealed Electronic Equipment

  • Zhigang Sun
  • , Kaiwen Xiao
  • , Hao Chen
  • , Guotao Wang
  • , Bao Liang
  • , Guofu Zhai*
  • *Corresponding author for this work
  • School of Electrical Engineering and Automation, Harbin Institute of Technology
  • Heilongjiang University
  • Jiangsu University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Existing research has constructed the loose particle localization model (LPLM) with excellent classification performance, achieving accurate data classification. However, the loose particle localization results have not been provided, and the construction process of the LPLM has not been comprehensively analyzed. Thus, the practicality of improving classification performance has not been comprehensively understood. Based on this, this article conducts reliability evaluation and functional module analysis of the LPLM. First, the essence of data classification in the LPLM is explored, and a majority voting process is added to achieve the conversion of data classification results to loose particle localization results. Thus, the role of the classification performance of the LPLM in the loose particle localization results is clearly demonstrated. Second, the construction process of the LPLM is comprehensively analyzed, and the impact of the five functional modules on classification performance is quantitatively evaluated and compared, with key functional modules highlighted. Therefore, the practicality of the LPLM is reasonably explained. The experimental results show that, when the classification accuracy achieved by the LPLM based on parameter-optimized XGBoost is stable above 0.53, accurate and reliable loose particle localization results can be obtained. Among them, 'pulse processing' and 'feature construction' are two key functional modules that have a significant impact on the classification performance of the LPLM, with performance degradation amplitudes of 0.1019 and 0.0964, respectively. They need to be taken seriously to maintain stable and excellent classification performance.

Original languageEnglish
Title of host publication2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages252-258
Number of pages7
ISBN (Electronic)9798331554705
DOIs
StatePublished - 2025
Externally publishedYes
Event7th International Conference on System Reliability and Safety Engineering, SRSE 2025 - Changchun, China
Duration: 20 Nov 202523 Nov 2025

Publication series

Name2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025

Conference

Conference7th International Conference on System Reliability and Safety Engineering, SRSE 2025
Country/TerritoryChina
CityChangchun
Period20/11/2523/11/25

Keywords

  • Classification performance
  • Functional module analysis
  • Loose particle localization
  • Reliability evaluation

Fingerprint

Dive into the research topics of 'Reliability Evaluation and Functional Module Analysis of the Loose Particle Localization Model for Sealed Electronic Equipment'. Together they form a unique fingerprint.

Cite this