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Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas

  • Bokai Zheng
  • , Cen Chen*
  • , Wei Zhang
  • , Rao Fu
  • , Yifan Hu
  • , Yigang Lin
  • , Chunqing Wang
  • , Guofu Zhai
  • *Corresponding author for this work
  • School of Electrical Engineering and Automation, Harbin Institute of Technology
  • China Academy of Aerospace Standardization and Product Assurance
  • Wenzhou University
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Random effects are ubiquitous in the degradation processes of multiple performance characteristics (PCs) of a complex system, and these PCs are not commonly independent. Neglecting either of the above features will lead to bias in system reliability estimation. Therefore, this study develops a reliability estimation method for the complex systems with multiple PC degradations considering both of the features. First, a Wiener process-based marginal degradation model with random effects (including the random initial PC, unit-to-unit variability, temporal uncertainty, and measurement errors) is proposed to track the degradation path of each PC. A model based on D-vine copulas is put forward to describe the correlation among multiple PCs. Then, a system reliability function is derived based on the two models. Furthermore, a two-step statistical inference is developed to estimate the unknown parameters in the system reliability function. Finally, using a practical case, the effectiveness of the proposed method is illustrated.

Original languageEnglish
Article number114640
JournalMicroelectronics Reliability
Volume138
DOIs
StatePublished - Nov 2022
Externally publishedYes

Keywords

  • D-vine copula
  • Dependent performance characteristics (PCs)
  • Random effects
  • Reliability estimation
  • Wiener process

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