Abstract
Random effects are ubiquitous in the degradation processes of multiple performance characteristics (PCs) of a complex system, and these PCs are not commonly independent. Neglecting either of the above features will lead to bias in system reliability estimation. Therefore, this study develops a reliability estimation method for the complex systems with multiple PC degradations considering both of the features. First, a Wiener process-based marginal degradation model with random effects (including the random initial PC, unit-to-unit variability, temporal uncertainty, and measurement errors) is proposed to track the degradation path of each PC. A model based on D-vine copulas is put forward to describe the correlation among multiple PCs. Then, a system reliability function is derived based on the two models. Furthermore, a two-step statistical inference is developed to estimate the unknown parameters in the system reliability function. Finally, using a practical case, the effectiveness of the proposed method is illustrated.
| Original language | English |
|---|---|
| Article number | 114640 |
| Journal | Microelectronics Reliability |
| Volume | 138 |
| DOIs | |
| State | Published - Nov 2022 |
| Externally published | Yes |
Keywords
- D-vine copula
- Dependent performance characteristics (PCs)
- Random effects
- Reliability estimation
- Wiener process
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