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Regularly Truncated M-Estimators for Learning With Noisy Labels

  • Xiaobo Xia
  • , Pengqian Lu
  • , Chen Gong
  • , Bo Han
  • , Jun Yu*
  • , Jun Yu*
  • , Tongliang Liu
  • *Corresponding author for this work
  • The University of Sydney
  • University of Technology Sydney
  • Nanjing University of Science and Technology
  • Hong Kong Polytechnic University
  • Hong Kong Baptist University
  • University of Science and Technology of China
  • Hangzhou Dianzi University

Research output: Contribution to journalArticlepeer-review

Abstract

The sample selection approach is very popular in learning with noisy labels. As deep networks 'learn pattern first', prior methods built on sample selection share a similar training procedure: the small-loss examples can be regarded as clean examples and used for helping generalization, while the large-loss examples are treated as mislabeled ones and excluded from network parameter updates. However, such a procedure is arguably debatable from two folds: (a) it does not consider the bad influence of noisy labels in selected small-loss examples; (b) it does not make good use of the discarded large-loss examples, which may be clean or have meaningful information for generalization. In this paper, we propose regularly truncated M-estimators (RTME) to address the above two issues simultaneously. Specifically, RTME can alternately switch modes between truncated M-estimators and original M-estimators. The former can adaptively select small-losses examples without knowing the noise rate and reduce the side-effects of noisy labels in them. The latter makes the possibly clean examples but with large losses involved to help generalization. Theoretically, we demonstrate that our strategies are label-noise-tolerant. Empirically, comprehensive experimental results show that our method can outperform multiple baselines and is robust to broad noise types and levels.

Original languageEnglish
Article number10375792
Pages (from-to)3522-3536
Number of pages15
JournalIEEE Transactions on Pattern Analysis and Machine Intelligence
Volume46
Issue number5
DOIs
StatePublished - 1 May 2024
Externally publishedYes

Keywords

  • Learning with noisy labels
  • generalization
  • regularly truncated M-estimators
  • sample selection
  • truncated M-estimators

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