Skip to main navigation Skip to search Skip to main content

Region-Aware Multiple Instance Learning for Whole Slide Image Classification: Dual-Layer Attention Network Inspired by Pathologists

  • Hailun Cheng
  • , Shenjin Huang
  • , Runming Wang
  • , Linghan Cai
  • , Yongbing Zhang
  • Tsinghua University
  • Faculty of Computing, Harbin Institute of Technology
  • School of Computer Science and Technology, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Computer-aided pathological diagnosis based on whole slide image (WSI) classification plays an important role in clinical practice, and it is often formulated as a weakly supervised multiple instance learning (MIL) problem. In recent years, attention-based MIL methods have yielded a promising solution for WSI classification. However, these methods usually directly generate instance-level attention scores under weak supervision signals, which often leads to inaccurate attention localization. Moreover, they fail to model the contextual relationships among patches, which are crucial for the diagnosis of WSI, given the continuum of tissue organization. To overcome these issues, we propose a region-aware dual-layer attention MIL network (RAMIL) for WSI classification. RAMIL mimics the diagnostic process of a pathologist and divides attention generation into two steps, from region refinement to instances. Specifically, the region attention module first divides the WSI into different regions based on the spatial position relationship of the patch, evaluating their importance and optimizing the instance features. Then it can generate more reasonable instance attention and aggregate instance features through the instance attention module, achieving more accurate classification and stronger model interpretability. Extensive experiments on three large public benchmarks demonstrate that RAMIL significantly outperforms state-of-the-art WSI classification methods.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE International Conference on Medical Artificial Intelligence, MedAI 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages231-238
Number of pages8
ISBN (Electronic)9798350377613
DOIs
StatePublished - 2024
Externally publishedYes
Event2nd IEEE International Conference on Medical Artificial Intelligence, MedAI 2024 - Chongqing, China
Duration: 15 Nov 202417 Nov 2024

Publication series

NameProceedings - 2024 IEEE International Conference on Medical Artificial Intelligence, MedAI 2024

Conference

Conference2nd IEEE International Conference on Medical Artificial Intelligence, MedAI 2024
Country/TerritoryChina
CityChongqing
Period15/11/2417/11/24

Keywords

  • instance attention
  • multiple instance learning
  • pathologist's diagnostic process
  • region attention
  • whole slide image classification

Fingerprint

Dive into the research topics of 'Region-Aware Multiple Instance Learning for Whole Slide Image Classification: Dual-Layer Attention Network Inspired by Pathologists'. Together they form a unique fingerprint.

Cite this