Abstract
Degradation of fluorinated organic pollutants remains a challenge due to the strong electronegativity of fluorine and the high structural stability of C-F bonds. Advanced reduction processes (ARPs) based on strong reducibility of hydrated electrons (eaq-) are effective for destroying recalcitrant fluorinated organic pollutants. Ultraviolet (UV) photolysis is a frequently used method for producing eaq-, but it is limited by the need for chemical addition and light-shielding effects. This study reported the generation of eaq- via electron tunneling based on the n+Si/Al2O3 cathode with a metal-insulator-semiconductor (MIS) structure for the rapid reductive degradation of a halogenated emerging pollutant (florfenicol, FLO). The results demonstrate that the n+Si/Al2O3 cathode achieved 97.5% degradation (30 min), accounting for 92.3% defluorination and 97.0% dechlorination (120 min). The electrogenerated eaq- was responsible for the degradation and dehalogenation of FLO, as indicated by electron spin resonance (ESR) measurements, scavenger experiments, and electrochemiluminescence (ECL) tests. The theoretical calculations revealed the occurrence of electron tunneling on the thin Al2O3 film at the n+Si/Al2O3 cathode, where the tunneling electron jumped to the water to form eaq-. The ARPs based on electrogenerated eaq- also demonstrated efficient degradation of chloramphenicol (CAP), hydroxychloroquine (HCQ), and levofloxacin (LVF). This study not only provides a simple approach to eaq- generation via the electron tunneling effect but also suggests a possible strategy for developing ARPs to remove halogenated emerging organic pollutants in water.
| Original language | English |
|---|---|
| Pages (from-to) | 2668-2675 |
| Number of pages | 8 |
| Journal | ACS ES and T Engineering |
| Volume | 4 |
| Issue number | 11 |
| DOIs | |
| State | Published - 8 Nov 2024 |
| Externally published | Yes |
Keywords
- defluorination
- electron tunneling effect
- fluorinated organic pollutants
- hydrated electrons
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