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Reduction of Random Variables in EMC Uncertainty Simulation Model

  • Jinjun Bai
  • , Yixuan Wan
  • , Ming Li
  • , Gang Zhang
  • , Xin He
  • Dalian Maritime University
  • Aviation Industry Corporation
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

To improve the reliability of simulation results, uncertainty analysis methods were developed in the Electromagnetic Compatibility (EMC) field. Random variables are used to describe random events. The more random variables you have, the less efficient the simulation is. Therefore, many high-accuracy methods have the problem of dimensional disaster, which means the calculation efficiency decreases exponentially with the increase of the number of random variables. A random variable reduction strategy based on sensitivity analysis method is proposed in this paper, so as to improve the computational efficiency of the global uncertainty analysis method.

Original languageEnglish
Pages (from-to)941-947
Number of pages7
JournalApplied Computational Electromagnetics Society Journal
Volume37
Issue number9
DOIs
StatePublished - Sep 2022

Keywords

  • dimensional disaster
  • electromagnetic compatibility
  • random variable
  • sensitivity analysis method
  • uncertainty analysis method

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