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Recent results on key performance indicator oriented fault detection using the DB-KIT toolbox

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A new MATLAB toolbox DB-KIT was recently developed for the design and implementation of fault diagnosis systems. For the purpose of key performance indicator (KPI) oriented fault detection, over the past few years, a series of test statistics and the corresponding thresholds were derived based on the modified data structures originating from the existing multivariate statistical analysis tools. These data-driven approaches are numerically reliable, efficient and of high fault detection performance. Especially, the false alarm rates (FARs) under KPI-unrelated fault scenarios are suppressed with great efforts, which is the central task of the KPI-oriented fault detection problem. DB-KIT was firstly introduced at the 2016 IEEE Industrial Electronics Conference, and the initial results on algorithm efficiency and fault detection performance were reported in Comparison of KPI related fault detection algorithms using a newly developed MATLAB toolbox: DB-KIT with simulation tests on the Tennessee Eastman Process benchmark. This paper reports more recent results on a widely used numerical test and on a close-loop configured three-stage hot rolling mill process to reveal the performance of the algorithms at the extreme faulty conditions, and demonstrates the performance under the plant-wide performance supervised framework.

Original languageEnglish
Title of host publicationProceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages7103-7108
Number of pages6
ISBN (Electronic)9781538611272
DOIs
StatePublished - 15 Dec 2017
Event43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 - Beijing, China
Duration: 29 Oct 20171 Nov 2017

Publication series

NameProceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
Volume2017-January

Conference

Conference43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
Country/TerritoryChina
CityBeijing
Period29/10/171/11/17

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