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Ray tracing method for the grazing incidence flat-field imaging soft X-ray spectrometer

  • Quan Li Dong*
  • , Yun Quan Liu
  • , Hao Teng
  • , Ying Jun Li
  • , Jie Zhang
  • *Corresponding author for this work
  • Ludong University
  • Peking University
  • Collaborative Innovation Center of Quantum Matter
  • CAS - Institute of Physics
  • China University of Mining & Technology, Beijing
  • Shanghai Jiao Tong University

Research output: Contribution to journalArticlepeer-review

Abstract

A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments.

Original languageEnglish
Article number065206
JournalChinese Physics B
Volume23
Issue number6
DOIs
StatePublished - Jun 2014
Externally publishedYes

Keywords

  • flat-field grating spectrometer
  • soft X-ray diagnosis

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