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Raman spectroscopy and lattice dynamical stability study of 2D ferromagnetic semiconductor Cr2Ge2Te6 under high pressure

  • Wenna Ge
  • , Kailang Xu
  • , Wei Xia
  • , Zhenhai Yu*
  • , Hongyuan Wang
  • , Xiaolei Liu
  • , Jinggeng Zhao
  • , Xia Wang
  • , Na Yu
  • , Zhiqiang Zou
  • , Zhipeng Yan
  • , Lin Wang
  • , Ming Xu
  • , Yanfeng Guo
  • *Corresponding author for this work
  • ShanghaiTech University
  • Huazhong University of Science and Technology
  • University of Chinese Academy of Sciences
  • Center for High Pressure Science & Technology Advanced Research
  • Yanshan University

Research output: Contribution to journalArticlepeer-review

Abstract

The layered Cr2Ge2Te6 (CrGT) has captured vast attentions because it is capable of retaining the long-range ferromagnetic order even in its monolayer form, thus offering potential applications in spintronic devices. We report herein the Raman spectra of CrGT under pressure up to 35.1 GPa at room temperature. We observed a structural phase transition at ∼14 GPa as was revealed by a change in pressure derivate frequencies of the Eg3 and Ag1 modes. Both of the two peaks became broad and the Ag1 mode eventually disappeared with further increasing the pressure. Raman modes above 26.4 GPa could not be experimentally observed, suggesting that the CrGT was pressed into the amorphous phase. Interestingly, a pressure-induced soft phonon mode is identified in CrGT at ∼23 GPa by dynamical property calculation. The phonon instability at the Brillouin zone boundary T point is suggested as the driving force for the experimentally observed crystalline-to-crystalline phase transition at ∼ 18 GPa. The appearance of soft phonon might indicate the possibility of superconductivity induced by much higher pressure.

Original languageEnglish
Article number153368
JournalJournal of Alloys and Compounds
Volume819
DOIs
StatePublished - 5 Apr 2020

Keywords

  • 2D ferromagnetic semiconductor
  • High-pressure Raman spectroscopy
  • Soft mode
  • Structural phase transition

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