Radiation Stability of TiO2/SiO2 Bilayer Hollow Particles under Proton Irradiation

N. G. Morev; I. V. Verkhoturova; V. V. Neshchimenko; Chundong Li; Jinpeng Lv

doi:10.1134/S1027451026700709

Radiation Stability of TiO₂/SiO₂ Bilayer Hollow Particles under Proton Irradiation

N. G. Morev
, I. V. Verkhoturova
, V. V. Neshchimenko^*
, Chundong Li
, Jinpeng Lv

^*Corresponding author for this work

School of Materials Science and Engineering

Amur State University
Nanjing University of Aeronautics and Astronautics

Research output: Contribution to journal › Article › peer-review

Abstract

Abstract: A comparative analysis was performed of the diffuse reflectance spectra and their changes after irradiation with 100 keV protons of TiO₂/SiO₂ bilayer hollow particles. The intensity of radiation-induced absorption bands in hollow TiO₂/SiO₂ particles is lower than that in TiO₂ microparticles. The enhanced radiation resistance effect of TiO₂/SiO₂ bilayer hollow particles may be attributed to the high specific surface area of the particles, which serves as a sink for radiation defects, as well as to the presence of a protective amorphous SiO₂ layer on the surface of TiO₂ microspheres, which leads to a lower concentration of absorption centers in TiO₂ responsible for absorption in the visible spectral range.

Original language	English
Pages (from-to)	295-302
Number of pages	8
Journal	Journal of Surface Investigation
Volume	20
Issue number	2
DOIs	https://doi.org/10.1134/S1027451026700709
State	Published - Apr 2026

Keywords

defects
degradation
hollow particles
irradiation
microspheres
optical properties
protons
radiation resistance
silicon dioxide
titanium dioxide

Access to Document

10.1134/S1027451026700709

Cite this

@article{e4d96cc7348d40e18cafa2d8c26b23b2,

title = "Radiation Stability of TiO2/SiO2 Bilayer Hollow Particles under Proton Irradiation",

abstract = "Abstract: A comparative analysis was performed of the diffuse reflectance spectra and their changes after irradiation with 100 keV protons of TiO2/SiO2 bilayer hollow particles. The intensity of radiation-induced absorption bands in hollow TiO2/SiO2 particles is lower than that in TiO2 microparticles. The enhanced radiation resistance effect of TiO2/SiO2 bilayer hollow particles may be attributed to the high specific surface area of the particles, which serves as a sink for radiation defects, as well as to the presence of a protective amorphous SiO2 layer on the surface of TiO2 microspheres, which leads to a lower concentration of absorption centers in TiO2 responsible for absorption in the visible spectral range.",

keywords = "defects, degradation, hollow particles, irradiation, microspheres, optical properties, protons, radiation resistance, silicon dioxide, titanium dioxide",

author = "Morev, \{N. G.\} and Verkhoturova, \{I. V.\} and Neshchimenko, \{V. V.\} and Chundong Li and Jinpeng Lv",

note = "Publisher Copyright: {\textcopyright} Pleiades Publishing, Ltd. 2026.",

year = "2026",

month = apr,

doi = "10.1134/S1027451026700709",

language = "英语",

volume = "20",

pages = "295--302",

journal = "Journal of Surface Investigation",

issn = "1027-4510",

publisher = "Taylor \& Francis Group LLC",

number = "2",

}

TY - JOUR

T1 - Radiation Stability of TiO2/SiO2 Bilayer Hollow Particles under Proton Irradiation

AU - Morev, N. G.

AU - Verkhoturova, I. V.

AU - Neshchimenko, V. V.

AU - Li, Chundong

AU - Lv, Jinpeng

N1 - Publisher Copyright: © Pleiades Publishing, Ltd. 2026.

PY - 2026/4

Y1 - 2026/4

N2 - Abstract: A comparative analysis was performed of the diffuse reflectance spectra and their changes after irradiation with 100 keV protons of TiO2/SiO2 bilayer hollow particles. The intensity of radiation-induced absorption bands in hollow TiO2/SiO2 particles is lower than that in TiO2 microparticles. The enhanced radiation resistance effect of TiO2/SiO2 bilayer hollow particles may be attributed to the high specific surface area of the particles, which serves as a sink for radiation defects, as well as to the presence of a protective amorphous SiO2 layer on the surface of TiO2 microspheres, which leads to a lower concentration of absorption centers in TiO2 responsible for absorption in the visible spectral range.

AB - Abstract: A comparative analysis was performed of the diffuse reflectance spectra and their changes after irradiation with 100 keV protons of TiO2/SiO2 bilayer hollow particles. The intensity of radiation-induced absorption bands in hollow TiO2/SiO2 particles is lower than that in TiO2 microparticles. The enhanced radiation resistance effect of TiO2/SiO2 bilayer hollow particles may be attributed to the high specific surface area of the particles, which serves as a sink for radiation defects, as well as to the presence of a protective amorphous SiO2 layer on the surface of TiO2 microspheres, which leads to a lower concentration of absorption centers in TiO2 responsible for absorption in the visible spectral range.

KW - defects

KW - degradation

KW - hollow particles

KW - irradiation

KW - microspheres

KW - optical properties

KW - protons

KW - radiation resistance

KW - silicon dioxide

KW - titanium dioxide

UR - https://www.scopus.com/pages/publications/105047543286

U2 - 10.1134/S1027451026700709

DO - 10.1134/S1027451026700709

M3 - 文章

AN - SCOPUS:105047543286

SN - 1027-4510

VL - 20

SP - 295

EP - 302

JO - Journal of Surface Investigation

JF - Journal of Surface Investigation

IS - 2

ER -

Radiation Stability of TiO₂/SiO₂ Bilayer Hollow Particles under Proton Irradiation

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this