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Radiation stability of SiO2 micro- and nanopowders under electron and proton exposure

  • Chundong Li
  • , M. M. Mikhailov
  • , V. V. Neshchimenko*
  • *Corresponding author for this work
  • Tomsk State University of Control Systems and Radioelectronics
  • Harbin Institute of Technology
  • Amur State University

Research output: Contribution to journalArticlepeer-review

Abstract

The effects of proton and electron (E = 100 keV, F = 5 × 10 15 cm-2) exposure on the reflective spectra of SiO 2 micro- and nanopowders in wavelength range from 250 to 2500 nm have been investigated. It has been established that the reflectance and radiation stability of nanopowders is less than that of micropowders. This effect is caused by the high concentration of radiation defects, which act as surface absorption centers (Es′ centers) near the energies 5.47 and 4.45 eV, and peroxide silicon defects (SiOOSi) near the energy 3.84 eV.

Original languageEnglish
Pages (from-to)123-127
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume319
DOIs
StatePublished - 15 Jan 2014

Keywords

  • Nanopowders
  • Radiation stability
  • Reflective spectra
  • Silicon dioxide

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