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Radiation damage effects on double-junction GaInP2/GaAs solar cells

  • Yueyuan Wang
  • , Jianmin Hu*
  • , Yiyong Wu
  • , Jianwen Xu
  • , Jianfeng Lu
  • , Huijie Zhao
  • , Bin Qian
  • *Corresponding author for this work
  • Harbin Normal University
  • Harbin Institute of Technology
  • Shanghai Institute of Space Power Sources

Research output: Contribution to journalArticlepeer-review

Abstract

The radiation effects on a double-junction GaInP2/GaAs solar cell were studied under exposures of 100 keV protons, 10 MeV protons and 1 MeV electrons, in terms of changes on electrical properties and spectral response. The results indicate that the electrical property degradation of the double-junction GaInP2/GaAs solar cell under irradiation occurs mainly due to the damage in the GaAs sub-cell. The GaAs sub-cell damage is primarily attributed to the decrease in collection efficiency of the minority carriers coming from its base bottom. It is revealed from the cell behavior under exposure to 100 keV protons irradiation that under the AM0 illumination, there is no obvious damage defected in the tunnel junction between the GaInP2 and the GaAs sub cells. In addition, the tunnel junction between the GaInP2 and the GaAs sub-cells is stable and no boundary traps are formed.

Original languageEnglish
Pages (from-to)76-81
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume330
DOIs
StatePublished - 1 Jul 2014
Externally publishedYes

Keywords

  • Electrical properties
  • Irradiation effects
  • Spectral response
  • Tunnel junction

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