TY - GEN
T1 - Protection and Management of Internal Faults in Modular Smart Transformer
AU - Pereira, Thiago A.
AU - Camurca, Luis
AU - Ko, Youngjong
AU - Zhu, Rongwu
AU - Liserre, Marco
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/3
Y1 - 2020/3
N2 - High penetration of distributed generation and charging stations in the LV distribution grid leads the electric grid to be subjected to violations of voltage and current limits. The Smart Transformer (ST) can effectively solve these challenges by flexible power flow control. Moreover, the ST can provide the DC connectivities. Thus, power control and DC connectivity reduce the reinforcements in the electric grid assets. However, compared to the conventional power transformer, the power electronics-based ST is sensitive to internal faults. Thus, in this paper, the device level short-circuits protection, in particular of SiC-based power semiconductors, is designed first and then a post-fault management solution is proposed to improve the ST capability for fault tolerance and continuous operation. Experimental results are provided to clearly validate the effectiveness of the internal fault protection and management.
AB - High penetration of distributed generation and charging stations in the LV distribution grid leads the electric grid to be subjected to violations of voltage and current limits. The Smart Transformer (ST) can effectively solve these challenges by flexible power flow control. Moreover, the ST can provide the DC connectivities. Thus, power control and DC connectivity reduce the reinforcements in the electric grid assets. However, compared to the conventional power transformer, the power electronics-based ST is sensitive to internal faults. Thus, in this paper, the device level short-circuits protection, in particular of SiC-based power semiconductors, is designed first and then a post-fault management solution is proposed to improve the ST capability for fault tolerance and continuous operation. Experimental results are provided to clearly validate the effectiveness of the internal fault protection and management.
UR - https://www.scopus.com/pages/publications/85087741324
U2 - 10.1109/APEC39645.2020.9124180
DO - 10.1109/APEC39645.2020.9124180
M3 - 会议稿件
AN - SCOPUS:85087741324
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 1762
EP - 1769
BT - APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 35th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2020
Y2 - 15 March 2020 through 19 March 2020
ER -