Abstract
Recent theoretical and experimental progress of dielectric loss of microwave dielectric ceramics (MDCs) was reviewed. Influence of micro-structural elements, such as pores, secondary phases and impurities, on dielectric properties of MDCs were discussed. The applications of far infrared spectra/damped oscillator model, and the contribution of double-phonon or multi-phonon process to dielectric properties were introduced. The prospective development of MDCs was also suggested.
| Original language | English |
|---|---|
| Pages (from-to) | 511-514 |
| Number of pages | 4 |
| Journal | Cailiao Kexue yu Gongyi/Material Science and Technology |
| Volume | 15 |
| Issue number | 4 |
| State | Published - Aug 2007 |
Keywords
- Dielectric loss
- IR
- Intrinsic loss
- Microstructure
- Microwave dielectric ceramics
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