Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy

Yufeng Hao; Yingying Wang; Lei Wang; Zhenhua Ni; Ziqian Wang; Rui Wang; Chee Keong Koo; Zexiang Shen; John T.L. Thong

doi:10.1002/smll.200901173

Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy

Yufeng Hao^*
, Yingying Wang
, Lei Wang
, Zhenhua Ni
, Ziqian Wang
, Rui Wang
, Chee Keong Koo
, Zexiang Shen
, John T.L. Thong

^*Corresponding author for this work

National University of Singapore
Nanyang Technological University

Research output: Contribution to journal › Article › peer-review

758 Scopus citations

Abstract

Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphenebased electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of ABstacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking electronic structure graphene, Raman spectroscopy, stacking.

Original language	English
Pages (from-to)	195-200
Number of pages	6
Journal	Small
Volume	6
Issue number	2
DOIs	https://doi.org/10.1002/smll.200901173
State	Published - 18 Jan 2010
Externally published	Yes

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10.1002/smll.200901173

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abstract = "Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphenebased electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of ABstacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking electronic structure graphene, Raman spectroscopy, stacking.",

author = "Yufeng Hao and Yingying Wang and Lei Wang and Zhenhua Ni and Ziqian Wang and Rui Wang and Koo, \{Chee Keong\} and Zexiang Shen and Thong, \{John T.L.\}",

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AU - Hao, Yufeng

AU - Wang, Yingying

AU - Wang, Lei

AU - Ni, Zhenhua

AU - Wang, Ziqian

AU - Wang, Rui

AU - Koo, Chee Keong

AU - Shen, Zexiang

AU - Thong, John T.L.

PY - 2010/1/18

Y1 - 2010/1/18

N2 - Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphenebased electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of ABstacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking electronic structure graphene, Raman spectroscopy, stacking.

AB - Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphenebased electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of ABstacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking electronic structure graphene, Raman spectroscopy, stacking.

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U2 - 10.1002/smll.200901173

DO - 10.1002/smll.200901173

M3 - 文章

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AN - SCOPUS:76749125968

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ER -

Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy

Abstract

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