Abstract
LaSe2 films were prepared on sapphire (0001) substrates by combining magnetron sputtering and selenized annealing. The influence of selenized annealing time on the structures and photoelectric properties of the thin films were investigated using glancing incident X-ray diffraction, fourier transform infrared spectrometry and Hall effect measurements. The results showed that the film had a perfect monoclinic structure and a smooth surface morphology. The average transmittance in the mid-infrared range was greater than 55%, and the highest was 65%. The LaSe2 films had a higher carrier concentration (∼1019 cm−3) and conductivity (∼1.9 S/cm) than those of other P-type transparent conductive films, which showed that LaSe2 was a potential new P-type material.
| Original language | English |
|---|---|
| Pages (from-to) | 250-253 |
| Number of pages | 4 |
| Journal | Materials Letters |
| Volume | 254 |
| DOIs | |
| State | Published - 1 Nov 2019 |
Keywords
- Electrical properties
- LaSe films
- Mid-infrared
- Selenized annealing
- Sputtering
Fingerprint
Dive into the research topics of 'Preparation of P-type LaSe2 films with conductivity and mid-infrared transparency by combining magnetron sputtering and selenized annealing'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver