Preparation and properties of SrBi2.2Ta2O9 thin film

Wen Wang; De Chang Jia; Yu Zhou

doi:10.1007/s11771-005-0164-0

Preparation and properties of SrBi_2.2Ta₂O₉ thin film

Wen Wang^*
, De Chang Jia
, Yu Zhou

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

SrBi_2.2Ta₂O₉ (SBT) thin film with thickness of 2 μm was successfully prepared by sol-gel method, using strontium acetate semihydrate [Sr(CH₃COO)₂·1/2H₂O] and bismuth subnitrate[BiO(NO₃)], and tantalum ethoxide [Ta(OCH₂CH₃)₅] as source materials, glacial acetic and ethylene glycol as solvents. The X-ray diffraction (XRD) and transmission electron microscope (TEM) results indicate that SBT layer-perovskite phase obtained has to be single phase, SBT thin film is formed after being annealed at 800°C for 1 min. The typical hysteresis loop of SBT thin film on Pt/Ti/SiO₂/Si is obtained, and the measured polarization value of the SBT thin film is 4.2 μC/cm².

Original language	English
Pages (from-to)	376-379
Number of pages	4
Journal	Journal of Central South University of Technology (English Edition)
Volume	12
Issue number	4
DOIs	https://doi.org/10.1007/s11771-005-0164-0
State	Published - Aug 2005

Keywords

Ferroelectric
Sol-gel technique
SrBiTaO
Thin film

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10.1007/s11771-005-0164-0

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title = "Preparation and properties of SrBi2.2Ta2O9 thin film",

abstract = "SrBi2.2Ta2O9 (SBT) thin film with thickness of 2 μm was successfully prepared by sol-gel method, using strontium acetate semihydrate [Sr(CH3COO)2·1/2H2O] and bismuth subnitrate[BiO(NO3)], and tantalum ethoxide [Ta(OCH2CH3)5] as source materials, glacial acetic and ethylene glycol as solvents. The X-ray diffraction (XRD) and transmission electron microscope (TEM) results indicate that SBT layer-perovskite phase obtained has to be single phase, SBT thin film is formed after being annealed at 800°C for 1 min. The typical hysteresis loop of SBT thin film on Pt/Ti/SiO2/Si is obtained, and the measured polarization value of the SBT thin film is 4.2 μC/cm2.",

keywords = "Ferroelectric, Sol-gel technique, SrBiTaO, Thin film",

author = "Wen Wang and Jia, \{De Chang\} and Yu Zhou",

year = "2005",

month = aug,

doi = "10.1007/s11771-005-0164-0",

language = "英语",

volume = "12",

pages = "376--379",

journal = "Journal of Central South University of Technology (English Edition)",

issn = "1005-9784",

publisher = "Springer Science + Business Media",

number = "4",

}

TY - JOUR

T1 - Preparation and properties of SrBi2.2Ta2O9 thin film

AU - Wang, Wen

AU - Jia, De Chang

AU - Zhou, Yu

PY - 2005/8

Y1 - 2005/8

N2 - SrBi2.2Ta2O9 (SBT) thin film with thickness of 2 μm was successfully prepared by sol-gel method, using strontium acetate semihydrate [Sr(CH3COO)2·1/2H2O] and bismuth subnitrate[BiO(NO3)], and tantalum ethoxide [Ta(OCH2CH3)5] as source materials, glacial acetic and ethylene glycol as solvents. The X-ray diffraction (XRD) and transmission electron microscope (TEM) results indicate that SBT layer-perovskite phase obtained has to be single phase, SBT thin film is formed after being annealed at 800°C for 1 min. The typical hysteresis loop of SBT thin film on Pt/Ti/SiO2/Si is obtained, and the measured polarization value of the SBT thin film is 4.2 μC/cm2.

AB - SrBi2.2Ta2O9 (SBT) thin film with thickness of 2 μm was successfully prepared by sol-gel method, using strontium acetate semihydrate [Sr(CH3COO)2·1/2H2O] and bismuth subnitrate[BiO(NO3)], and tantalum ethoxide [Ta(OCH2CH3)5] as source materials, glacial acetic and ethylene glycol as solvents. The X-ray diffraction (XRD) and transmission electron microscope (TEM) results indicate that SBT layer-perovskite phase obtained has to be single phase, SBT thin film is formed after being annealed at 800°C for 1 min. The typical hysteresis loop of SBT thin film on Pt/Ti/SiO2/Si is obtained, and the measured polarization value of the SBT thin film is 4.2 μC/cm2.

KW - Ferroelectric

KW - Sol-gel technique

KW - SrBiTaO

KW - Thin film

UR - https://www.scopus.com/pages/publications/26644460668

U2 - 10.1007/s11771-005-0164-0

DO - 10.1007/s11771-005-0164-0

M3 - 文章

AN - SCOPUS:26644460668

SN - 1005-9784

VL - 12

SP - 376

EP - 379

JO - Journal of Central South University of Technology (English Edition)

JF - Journal of Central South University of Technology (English Edition)

IS - 4

ER -

Preparation and properties of SrBi_2.2Ta₂O₉ thin film

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Keywords

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