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Preparation and characterization of TaNbTiW multi-element alloy films

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, a novel combination approach is used to prepare TaNbTiW multi-element alloy films. The composition, microstructure and mechanical properties of the alloy films are investigated. X-ray diffraction (XRD) shows that the films have bcc structure, and the lattice constant strongly depends on film composition. The films have residual stress in the range of -0.1 to -2.63 GPa. Their hardness and modulus attain to the values about 5.2 and 127.2 GPa, respectively. After annealed at 500 °C and 700 °C for 90 min in vacuum, the films reveal no phase transformation.

Original languageEnglish
Pages (from-to)447-453
Number of pages7
JournalApplied Surface Science
Volume261
DOIs
StatePublished - 15 Nov 2012

Keywords

  • Hardness
  • Multi-elements alloy films
  • Multi-targets magnetron sputtering
  • Structure

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